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JC power device test socket GD18-TO263-K-109 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-263-3 and D2PAK package

JC power device test socket T3P-L214-ST-BK semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package

JC power device test socket T3P-L214-ST-HT semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package (high-temperature)

JC power device test socket T4P-L214-ST-HT semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package (high-temperature)

JC power device test socket T4P-L214-ST-BK semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package

JC power device test socket T3P-L214-ST-BK-SN semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package

JC power device test socket T4P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package (high-temperature)

JC power device test socket T3P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package

JC power device test socket T4P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package

JC power device test socket T3P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package (high-temperature)

PMK high-voltage differential probe adapter connector 4 mm to Testpoint-Adapter for BUMBLEBEE and HORNET series

PMK PHV665-L/200 High-Voltage Passive Probe 200:1 120MHz 2800Vrms 6kVpk