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JC power device test socket T4P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package
JC power device test socket T4P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 packageBrand: JC Electronics
Origin: Japan
Fixtures & Accessories. Detailed specifications are available in the product datasheet.
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JC power device test socket T3P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package (high-temperature)
JC power device test socket T3P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package (high-temperature)Brand: JC Electronics
Origin: Japan
Fixtures & Accessories. Detailed specifications are available in the product datasheet.
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PMK high-voltage differential probe adapter connector 4 mm to Testpoint-Adapter for BUMBLEBEE and HORNET series
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PMK PHV665-L/200 High-Voltage Passive Probe 200:1 120MHz 2800Vrms 6kVpk
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Double-pulse dynamic test system PD-200X wide-bandgap semiconductor SiC power device parameters evaluation Jectronic & Probemart
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CYBERTEK high-voltage differential probe HVP6700G isolated voltage 350M high-frequency 7000 V
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CYBERTEK high-voltage differential probe HVP6350G isolated voltage 350M high-frequency 3500 V
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CYBERTEK high-voltage differential probe HVP6150G isolated voltage 350M high-frequency 1500 V
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CYBERTEK high-voltage differential probe HVP6700F isolated voltage 200M high-frequency 7000 V

















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