PD-200X Cost-Effective Double-Pulse Test Platform and Its Three Key Features

Jectronic Instruments PD-200X high cost-effectiveness

Double-pulse dynamic test platform and three key features

The PD-200X double-pulse dynamic test platform developed and manufactured by Jectronic Instruments offers high cost-effectiveness, high stability, and versatility, with a modular intelligent design,

It has excellent instrument and probe compatibility; its high-redundancy safety ensures the safety of high-voltage and high-current test devices and personnel. This system is currently the most

cost-effective double-pulse test system, particularly suitable for universities, research institutes, and startup semiconductor companies.

With the PD-200X dynamic test platform, the performance and reliability of IGBT/MOSTET devices can be evaluated, and the gate-driver circuit and thermal design can be optimized,

improving system efficiency and reliability. The double-pulse test method adopted by the platform is widely used in inverters, electric vehicles, renewable energy generation, and other fields.

1. System framework

The PD-200X system mainly consists of a high-performance oscilloscope, high-performance voltage and current probes, a high-voltage power supply, an optional inductive load, a power module mounting table,

program control software, fixtures, etc., as shown in the figure below.

The system integrates the main test equipment into a viewable safety enclosure, greatly improving personnel and equipment safety; combined with the program control module and PC host software,

to achieve intelligent operation control.

2. Hardware configuration

Basic configuration:

1. Pulse generator

Supports single-pulse and double-pulse modes, 0.5~200μS adjustable, with fiber-optic and BNC output options, and safety control via host software.

2. High-voltage power supply

Provides the DC voltage required for testing, with a maximum operating voltage of up to 1200V, expandable to 1700V, and integrates a charge/discharge circuit.

3. High-performance SiC digital gate driver

Gate voltage manually adjustable in six steps, -5V~+18V; compatible with the optically isolated probe interfaces of almost all brands on the market, such as Tektronix, PMK, and Cybertek, and supports differential probes of all brands.

4. Adjustable load inductor, AirC100 series

Independently designed air-core inductor with high linearity and taps for easy connection; inductance manually adjustable in five steps: 10uH, 20uH, 50uH, 100uH, and 200uH.

5. Safety protection enclosure

360° visible explosion-proof enclosure with system equipment integrated into one unit, ensuring safety protection for equipment and personnel; newly upgraded intelligent safety alarm and voltage-reduction trigger.

Optional equipment:

6. High-definition digital oscilloscope

The system is compatible with oscilloscopes of all brands on the market; the high-configuration version can be equipped with an IWATSU DS-8000 series 12-bit high-definition oscilloscope.

7. Signal acquisition probes

There are mainly 4 types of front-end acquisition probes: a high-CMRR optically isolated probe for Vgs, a high-voltage differential probe for Vds, and a high-frequency non-inductive resistor that can be fitted with a Rogowski coil for Id.

High-configuration version: for Vgs measurement, PMK's FireFly® series optically isolated probe is recommended (1.5GHz high frequency, DC-180dB);

For Vds measurement, PMK's Bumblebee high-voltage differential probe is recommended (400MHz); for Id measurement, an American T&M non-inductive coaxial shunt is recommended (400MHz~2GHz),

An IWATSU Rogowski coil can be added (optional high temperature resistance 150℃, minimum wire diameter 1mm).

For medium- and low-configuration versions, domestically produced Cybertek optically isolated and high-voltage differential probes can be considered; a UK PEM Rogowski coil can be used; users can select according to budget and performance requirements.

8. Heating option (TO-247 package)

The PD-200X integrates a single-device heating fixture; it is convenient to use and safe and reliable, and supports multiple temperature environments with a maximum temperature up to 175℃.

III. Three featured functions of the system:

1. Heating equipment

Jiechuang Instruments patented product—device heating fixture, supports TO-247 package, is convenient and stable to plug and unplug, and can achieve rapid heating (from room temperature to maximum temperature in only just over 10 minutes),

Both the main unit and the PC host computer support operation and settings. In addition to common temperatures such as 125°C, 150°C, and 175°C, any temperature from room temperature to 175°C can be set, meeting the testing requirements of various applications.

2. Safety protection

5 mm thick transparent safety enclosure; the safety door is equipped with a sensing device, alarm lamp device, and program-controlled software to achieve intelligent safety protection.

When the user opens the door, the alarm lamp provides a visual warning, and the high-voltage power supply rapidly reduces voltage to ensure personnel safety.

3. Program control module & PC host software

The three-in-one module integrating pulse control, safety detection, and temperature control, combined with PC host software, makes operation safer and more convenient; no operation on the high-voltage power supply and driver is required,

Waveform acquisition is triggered with one click. Voltage startup, pulse time, temperature, etc. are set directly on the PC, making the operating procedure simple and convenient.

Summary

PD-200X is a highly applicable double-pulse dynamic parameter testing device, a modular system-level dynamic test solution platform built on a LEGO-like concept.

The system uses flexible module interfaces and international-standard signal transmission protocols to ensure data interconnection and interoperability, and compatibility with high-speed signals between test instruments and sensors,

Consistency is traceable and the system is repeatable; it is one of the professional and efficient dynamic parameter testing solutions in the industry,

It is particularly suitable for the research, development, and performance evaluation of SiC wide-bandgap devices.