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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D
  • High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D

Brand: Jectronic Instruments

Origin: China

For TO 247-3 and TO 247-4 package device system, double-pulse dynamic parameters test semiconductor static
Overview

PHS-100 is a highly versatile heating device, mainly used in high-temperature testing environments for semiconductors,

and can be used in conjunction with dual-pulse dynamic parameter testing equipment or semiconductor static parameter testers.

This heating system uses an international standard signal transmission protocol to ensure data interconnection, interoperability, and traceability,

featuring high temperature control accuracy, ease of use, and compact size, making it one of the professional and efficient high-temperature testing solutions in the industry. 

The PHS-100 heating platform mainly consists of host computer software, the heating main unit, heating fixtures, and control cables.

The fixtures are currently available for TO 247-3 and TO 247-4 packages.

Specifications

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* Specifications are subject to change without notice.