Teledyne LeCroy high-frequency low-voltage active differential probe DL02-HCM oscilloscope isolated 250M/80 V

Key features

• Ideal probe for power conversion up to 48 V

• 250, 500 MHz, and 1 GHz bandwidth

• 80 V dynamic range

• 60 V common mode

• Highest accuracy

• 0.5% gain accuracy

• Precision gain calibration

• Best low-frequency flatness (0.1 dB)

• Lowest noise and highest rejection

• Extra-wide variety of tips

• High-performance soldering

• Browser

• Single pin and header

• Mini and micro grabbers

• Socket connection

• High-temperature solder-in

• Y-banana adapter

• ProBus active probe interface

Ideal probe for GaN power conversion up to 48 V

The 60 V common-mode and 80 V differential input ranges and 1 GHz bandwidth make these probes ideal for low-voltage GaN power conversion measurements. 

The 60 V common-mode range is well suited to handle any battery floating and bulk/absorption voltages during charging, while the 80 V differential input range provides sufficient margin to handle any overshoot.

Highest accuracy

The DL-HCM probe is calibrated to provide high-precision measurements within 0.5% at DC and achieve 100 dB flatness over the frequency range from DC to 0.1 MHz.

This ensures high-precision measurement of the top and bottom voltage levels of pulse-width-modulated signals. The precision gain calibration function further improves measurement accuracy,

improving gain accuracy and eliminating small offset drift in the measurement setup.

Lowest noise and highest rejection

The probe's common-mode rejection ratio (CMRR) is excellent at very high frequencies. This enables it, when measuring the very fast slopes (high dV/dt) typical of GaN devices and systems,

to provide the best measurement performance for PWM signals. The excellent CMRR, combined with low probe noise and high offset capability, enables the probe to measure very small control signals floating on a high common-mode voltage.

Various probe types

The 60 V common-mode differential probe provides a perfect combination of high performance and flexibility, suitable for connecting to any device under test. The optional accessory kit and high-temperature solder-in probes provide additional connection options.