Tektronix voltage probe TAP2500/TAP3500/TAP4000 active FET 2.5/3.5/4G high-bandwidth 4 V

TAP2500, TAP3500, and TAP4000 single-ended active FET probes provide perfect high-speed electrical and mechanical performance, meeting the requirements of today's digital system designs.

Main Features

• Outstanding electrical performance

• High probe bandwidth

• Fast probe rise time

• Perfect signal fidelity

• ≤0.8 pF input capacitance

• 40 kΩ input resistance

• -4 V ~ +4 V input dynamic range

• -10 V ~ +10 V DC input bias range

• ±30 V (DC + peak AC) maximum input voltage (non-destructive)

• Universal mechanical performance

• Compact small probe head for probing small circuit elements

• DUT connection accessories allow connection to SMD with a gap of at least 0.5 mm

• Robust design with high reliability

• Easy to use

• Directly connect to oscilloscopes with TekVPI™ probe interfaces

• Automatically determine units and readings on the oscilloscope display

• Easy access to the oscilloscope probe menu to obtain probe status/diagnostic information and control probe DC bias

• Remote control of probes via GPIB/USB through the oscilloscope

• Applications

• Inspection, debugging, and characterization of high-speed designs

• Signal integrity, jitter, and timing analysis

• Manufacturing engineering and testing

• Signal voltage swing up to 8 V p-p

TAP2500, TAP3500, and TAP4000 Active Probes for TekVPI™ Probe Interface

Selecting the appropriate probe for the application is key to achieving the best signal fidelity in measurements. Active probes provide more accurate signal reproduction and fidelity for high-frequency measurements. With our ultra-low input capacitance and unique interface, TAP2500, TAP3500, and TAP4000 single-ended active FET probes provide perfect high-speed electrical and mechanical performance, meeting the requirements of today's digital system designs.

TAP2500, TAP3500, and TAP4000 active FET probes are designed for use with oscilloscopes with TekVPI™ probe interfaces and direct connection, achieving high-speed signal acquisition and measurement fidelity by addressing three traditional issues:

• ≤0.8 pF input capacitance and 40 kΩ input resistance, causing less DUT load impact

• Can connect to small SMDs using the multifunction DUT connection

• Maintains instrument bandwidth at the probe tip, supporting oscilloscopes up to 3.5 GHz