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IWATSU SS-663 ultra-fine 1 mm IWATSU Catalog
IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for
  • IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for

IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for

Brand: IWATSU

Origin: Japan

SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, withstand voltage 600 V (P 1200 V), high-frequency bandwidth 30 MHz, SS-663(P) measurable peak 120 A saturation
Overview

Main features of the SS-660(P) series:




The coil diameter at the tip of the probe is 1mm (1.2mm for P type), very thin.


Can directly detect in narrow areas such as surface-mounted devices.


Has a frequency bandwidth of 30MHz, allowing observation of high-frequency switching waveforms.


Current measurement range is 30A~1200A, supporting various current measurements.


Because it does not saturate magnetically, large current measurements can be performed with confidence.


The probe section is suitable for temperatures ranging from -40°C to 125°C.



Specifications
Parameter Value
Peak Current 120 A
High Frequency Bandwidth 30 MHz
Low Frequency Cut-off 65 Hz
Frequency Bandwidth 65 Hz~30 MHz
Peak di/dt 8 kA/µs
Sensitivity 50 mV/A
Typical Accuracy ±2%
Noise 3.5 mV (rms, effective value)
Coil Withstand Voltage 1.2 kV
Operating Temperature -40~+125 °C
Zero Adjustment Yes
Coil Diameter Max 1.2 mm
Coil Length 84±4 mm
Cable Length 1.5 m
Expand IWATSU SS-663 ultra-fine 1 mm

* Specifications are subject to change without notice.