Micsig SigOFIT optically isolated probe MOIP series (+/-0.1-5000V differential voltage)1G high-bandwidth

SigOFIT optically isolated probe

Optically isolated probe based on proprietary SigOFIT™ technology, with extremely high common-mode rejection ratio

and isolation voltage; within its bandwidth, it reveals the full truth of the signal and serves to judge other

voltage probes' measured-signal authenticity as the ultimate arbiter. In addition,SigOFIT optically isolated probe

Uses advanced laser power supply technology to fully resolve the isolated power supply issue.

Bandwidth:DC-1GHz          Common-mode voltage: 60kVpk  

DC gain accuracy:1%      Common-mode rejection ratio:up to 180dB

————————————————————————————————————

Application areas:

When there is doubt about the accuracy and authenticity of results measured by other voltage probes,

the SigOFIT optically isolated probe can serve as the final arbitration reference.

● Power supply equipment evaluation, current shunt measurement, EMI and ESD troubleshooting

● Motor drive design, power converter design, electronic ballast design

● Design and analysis of GaN, SiC, and IGBT half-/full-bridge devices

● Safety isolation testing for high-voltage, high-bandwidth test applications

● Testing of inverters, UPS, and switching power supplies

● Wide-voltage, wide-bandwidth test applications

● Various floating measurements

————————————————————————————————————

Most faithful signal representation

The SigOFIT optically isolated probe has an extremely high common-mode rejection ratio: CMRR is as high as 128 dB at 100 MHz and still as high as 108 dB at 1 GHz, making it the ultimate arbiter for determining the fidelity of signals measured by other voltage probes.

Extremely high measurement accuracy and stability

As the ultimate arbiter for determining the fidelity of signals measured by other voltage probes, measurement accuracy is an important specification of the SigOFIT optically isolated probe. The SigOFIT optically isolated probe has excellent amplitude-frequency response, DC gain accuracy better than 1%, a noise floor less than 0.45 mVrms, zero drift less than 0.1% after 5 min warm-up, and gain drift less than 1%.

The best test method for third-generation semiconductors

Because third-generation semiconductor devices have very short turn-on and turn-off times, their signals have faster rising and falling edges and contain high-energy high-frequency harmonics. At maximum bandwidth, the SigOFIT optically isolated probe still has a common-mode rejection ratio exceeding 100 dB, can almost perfectly suppress oscillations caused by high-frequency common-mode noise, and presents a signal with no extra spurious components, making it the preferred choice for third-generation semiconductor testing.

No device failure when testing gallium nitride (GaN)

The SigOFIT optically isolated probe has short test leads and uses coaxial transmission; its input capacitance is less than 2.5 pF, making gallium nitride (GaN) testing very safe.

Flexible use

The SigOFIT optically isolated probe is smaller than conventional high-voltage differential probes, has more compact probe leads, and is more flexible and convenient to use.

Wider test range

Unlike high-voltage differential probes, which can only test high-voltage signals, the SigOFIT optically isolated probe can test differential-mode signals from ±0.1 V to ±5000 V by using different attenuators,

and achieves full-scale output and a very high signal-to-noise ratio.

Efficient and convenient

The SigOFIT optically isolated probe has fast response, can measure immediately after power-on, has a calibration time less than 1 s, and ensures accurate signal output in real time.

Application scenarios

When there are doubts about the accuracy or fidelity of results measured by other voltage probes, the SigOFIT optically isolated probe can serve as the final reference.

Power supply equipment evaluation, current shunt measurement, EMI and ESD troubleshooting

Motor drive design, power converter design, electronic ballast design

Design and analysis of GaN, SiC, and IGBT half-/full-bridge devices

Safety-isolated testing for high-voltage, high-bandwidth test applications

Testing of inverters, UPS, and switching power supplies

Wide-voltage, wide-bandwidth test applications

Various floating measurements