Tektronix high-frequency low-voltage differential probe P6248/P6247/P6246 high-bandwidth 400M/1G/1.5 GHz 25V

Features and Benefits

P6248

• 1.7 GHz (typical probe only ≤27℃) 1X mode

• 1.5 GHz bandwidth (guaranteed)

• 1.85 GHz (typical probe only ≤27℃) 10X mode

P6247

• >1.0 GHz bandwidth (guaranteed)

P6246

• 400 MHz bandwidth (guaranteed)

General

• Low input capacitance:

• Probe input connector: two standard 0.025 in/0.63 mm (0.1 in centers) square-pin sockets (female)

• ESD tolerance (IEC 801-2)

• Uses 1103 TekProbe® Power connects to TekProbe on TDS series oscilloscopes or other instruments® BNC interface

• Suitable for oscilloscopes, spectrum analyzers, or network analyzers

• >60 dB (1000:1) common-mode rejection ratio (CMRR)

• Small probe tip for easy SMD probing

Applications

• Communications (Gigabit Ethernet, IEEE-1394, Fibre Channel)

• Semiconductor characteristics description (RAMBUS)

• Disk drive read-channel design

• Communications pulse-shape consistency

• Jitter, crosstalk, and BERT measurements

• Ground-bounce localization

P6246, P6247, and P6248 differential probes

The P6248, P6247, and P6246 allow users to make time-domain or frequency-domain measurements on the high-bandwidth signals typically involved in disk drives, digital IC design (RAMBUS), and communications applications (Gigabit Ethernet, IEEE-1394 FireWire, and Fibre Channel). The P6248 has accessories that allow RAMBUS probing and IEEE-1394 interconnect access. The smaller geometry probe head and a variety of probe tip accessories enable these probes to easily perform manual probing of surface-mount devices while maintaining a high common-mode rejection ratio.

The P6246, P6247, and P6248 are well suited for disk drive read and channel electronics design verification, as well as timing analysis when troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse-shape or crosstalk conformance testing of high-speed communications signals.