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Probemart.com | Probes, current sensors & calibration sources for pulsed-power testing

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PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

Brand: PMK

Origin: Germany

ENVI® passive probe non- test, and-55°C to +155°C medium- measurement. 835-312-U01 PUHT:-55°C to 200°C

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Brand: Cybertek

Origin: China

Voltage Probe. Detailed specifications are available in the product datasheet.

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 package

JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 package

JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D

Brand: Jectronic Instruments

Origin: China

For TO 247-3 and TO 247-4 package device system, double-pulse dynamic parameters test semiconductor static

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel

High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel

Brand: Jectronic Instruments

Origin: China

For TO 247-3 and TO 247-4 package device system, double-pulse dynamic parameters test semiconductor static

CYBERTEK high-frequency AC/DC current probe MCP3100 (10000 A/ 1.5 MHz) Hall-effect sensor high-current

CYBERTEK high-frequency AC/DC current probe MCP3100 (10000 A/ 1.5 MHz) Hall-effect sensor high-current

CYBERTEK high-frequency AC/DC current probe MCP3100 (10000 A/ 1.5 MHz) Hall-effect sensor high-current

Brand: Cybertek

Origin: China

Isolated Current Probe. Detailed specifications are available in the product datasheet.

A series coaxial shunt PCB T&M resistor SBNC nut type dedicated accessories connector

A series coaxial shunt PCB T&M resistor SBNC nut type dedicated accessories connector

A series coaxial shunt PCB T&M resistor SBNC nut type dedicated accessories connector

Brand: Jectronic Instruments

Origin: China

SBNC-K247 是专为 T&M 无感同轴分流器 A 系列 SBNC 系列定制的 PCB 板安装座(螺母型同轴连接器)。具有低杂感、高可靠性的特点,使分流器易于拆装,可有效解决安装分流器时操作人员力度把握不好对分流器造…

Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high

Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high

Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high

Brand: Vamtek

Origin: China

Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high

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