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PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk
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Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz
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JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package
JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package
JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package
JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package
JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 package
JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D
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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel
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CYBERTEK high-frequency AC/DC current probe MCP3100 (10000 A/ 1.5 MHz) Hall-effect sensor high-current
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A series coaxial shunt PCB T&M resistor SBNC nut type dedicated accessories connector
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Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high


















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