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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D
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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel
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CYBERTEK high-frequency AC/DC current probe MCP3100 (10000 A/ 1.5 MHz) Hall-effect sensor high-current
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A series coaxial shunt PCB T&M resistor SBNC nut type dedicated accessories connector
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Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high
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Vamtek dedicated BNC-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high
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Vamtek dedicated BNC-SMA interface 3G high-frequency 50 Ω probe 0.2 m /0.5 m /1 m /2 m high
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Vamtek oscilloscope BNC 3G high-frequency 50 Ω probe 0.2 m /0.5 m /1 m /2 m high
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CYBERTEK high-frequency AC/DC current probe MCP3050 (5000 A/ 12 MHz) Hall-effect sensor high-current
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CYBERTEK high-frequency AC/DC current probe MCP3020 (2000 A/ 12 MHz) Hall-effect sensor high-current
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CYBERTEK high-frequency AC/DC current probe MCP3010 (1000 A / 12 MHz) Hall-effect sensor high-current
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KEYSIGHT optically isolated probe PS0008A high-frequency 1 GHz high-voltage 2500 V double-pulse dynamic test voltage measurement


















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