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IWATSU SS-660/SS-660P series ultra-fine IWATSU Catalog
IWATSU SS-660/SS-660P series ultra-fine 1 mm/1.2 mm high-frequency Rogowski coil current test probe SiC device
  • IWATSU SS-660/SS-660P series ultra-fine 1 mm/1.2 mm high-frequency Rogowski coil current test probe SiC device

IWATSU SS-660/SS-660P series ultra-fine 1 mm/1.2 mm high-frequency Rogowski coil current test probe SiC device

Brand: IWATSU

Origin: Japan

SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, withstand voltage 600 V (P 1200 V), high-frequency bandwidth 30 MHz, measurable peak A saturation
Overview

SS-660(P) series, the world's thinnest wire diameter Rogowski coil with a diameter of 1/1.2mm, the open-type coil is suitable for GaN device current measurement, withstands 600V (P series 1200V), high-frequency bandwidth of 30MHz, can measure current peaks up to 1200A without magnetic saturation limitation.






Main features of SS-660(P) series:


  • The coil at the top of the probe has a diameter of 1mm (1.2mm for P type), very thin

  • Can directly probe in narrow spaces such as surface-mounted devices.

  • With a frequency bandwidth of 30MHz, capable of observing high-frequency switching waveforms.

  • Current measurement range from 30A to 1200A, supporting various current measurements.

  • Since it does not experience magnetic saturation, large current measurements can be done safely.

  • Probe operating temperature range: -40℃ to 125℃





Specifications

660 Parameter Table.JPG

Expand IWATSU SS-660/SS-660P series ultra-fine

* Specifications are subject to change without notice.