Teledyne LeCroy high-frequency low-voltage active differential probe DL10-HCM oscilloscope isolated 1 GHz/80 V

Key features

• Ideal probe for power conversion up to 48 V

• 250, 500 MHz, and 1 GHz bandwidth

• 80 V dynamic range

• 60 V common-mode

• Highest accuracy

• 0.5% gain accuracy

• Precision gain calibration

• Best low-frequency flatness (0.1 dB)

• Lowest noise and highest rejection

• Extensive variety of tips

• High-performance soldering

• Browser

• Single pin and connector

• Mini and micro grabbers

• Socket connection

• High-temperature solder-in

• Y-banana adapter

• ProBus active probe interface

Ideal probe for GaN power conversion up to 48 V

60 V common-mode and 80 V differential input range and 1 GHz bandwidth make these probes ideal for low-voltage GaN power conversion measurement. 

The 60 V common mode is well suited to handle any floating and bulk/absorption voltages of the battery during charging, while the 80 V differential input range provides sufficient margin to cope with any overshoot.

Highest accuracy

The DL-HCM probes are calibrated for high-accuracy measurement within 0.5% at DC and achieve 100 dB flatness over the frequency range from DC to 0.1 MHz.

This ensures high-accuracy measurement of the top and bottom voltage levels of pulse-width modulated signals. The precision gain calibration function further improves measurement accuracy,

improving gain accuracy and eliminating small offset drift in the measurement configuration.

Lowest noise and highest rejection

The probe's common-mode rejection ratio (CMRR) is excellent at very high frequencies. This provides the best measurement performance when measuring the very fast slopes (high dV/dt) typical of GaN devices and systems,

PWM signals. The excellent CMRR combined with low probe noise and high offset capability enables the probe to measure very small control signals floating on a high common-mode voltage.

Various probe types

The 60 V common-mode differential probe offers the perfect combination of high performance and flexibility for connecting to any device under test. Optional accessory kits and high-temperature solder-in probes provide additional connection options.