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PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

Brand: PEM

Origin: UK

CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d…

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz

Brand: IWATSU

Origin: Japan

SS-531, rated current 30 A/5 A/0.5 A bandwidth 120 MHz, measurement AC and DC clamp-on

PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA

PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA

PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA

Brand: PEM

Origin: UK

CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,…

PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A

PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A

PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A

Brand: PEM

Origin: UK

CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,…

PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A

PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A

PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A

Brand: PEM

Origin: UK

CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,…

PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A

PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A

PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A

Brand: PEM

Origin: UK

CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,…

PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm)

PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm)

PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm)

Brand: PEM

Origin: UK

Mini coil series, up to 10 MHz, conductor diameter 3.5 mm, withstand voltage 2 kV/5 kV optional

IWATSU OpECS optically isolated current probe 150 MHz

IWATSU OpECS optically isolated current probe 150 MHz

IWATSU OpECS optically isolated current probe 150 MHz

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

T&M non-inductive coaxial shunt SDN-414 series high-frequency precision resistor (2 Watt)Sic/GaN wide-bandgap double-pulse Ids measurement

T&M non-inductive coaxial shunt SDN-414 series high-frequency precision resistor (2 Watt)Sic/GaN wide-bandgap double-pulse Ids measurement

T&M non-inductive coaxial shunt SDN-414 series high-frequency precision resistor (2 Watt)Sic/GaN wide-bandgap double-pulse Ids measurement

Brand: T&M Research

Origin: USA

T&M SDN-414 series low inductance high-frequency coaxial resistor, 0 2% ultra-high precision, 400-2000M hi…

Danisense fluxgate current sensor DS1000UB-10V voltage output PPM high-precision AC/DC probe (DC/AC)

Danisense fluxgate current sensor DS1000UB-10V voltage output PPM high-precision AC/DC probe (DC/AC)

Danisense fluxgate current sensor DS1000UB-10V voltage output PPM high-precision AC/DC probe (DC/AC)

Brand: Danisense

Origin: Denmark

DS1000UB-10V measurable AC 700 A, DC 1000 A, high-current 1100A, 300KHz bandwidth

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C

Brand: IWATSU

Origin: Japan

Isolated Current Probe. Detailed specifications are available in the product datasheet.

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