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PEM Rogowski coil CWT Mini50HF1 high-frequency 50 MHz flexible current probe 300 A PEM Rogowski coil CWT Mini50HF1 high-frequency 50 MHz flexible current probe 300 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF06 high-frequency 50 MHz flexible current probe 120 A PEM Rogowski coil CWT Mini50HF06 high-frequency 50 MHz flexible current probe 120 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF03 high-frequency 50 MHz flexible current probe 60 A PEM Rogowski coil CWT Mini50HF03 high-frequency 50 MHz flexible current probe 60 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF015 high-frequency 50 MHz flexible current probe 30 A PEM Rogowski coil CWT Mini50HF015 high-frequency 50 MHz flexible current probe 30 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM6 pulse current probe 1200 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM6 pulse current probe 1200 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM3 pulse current probe 600 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM3 pulse current probe 600 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM1 pulse current probe 300 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM1 pulse current probe 300 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM06 pulse current probe 120 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM06 pulse current probe 120 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM03 pulse current probe 60 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM03 pulse current probe 60 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details

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