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Magnelab sensor SPT-0375 transformer voltage 115 to 460 AC, 0.333 AC
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Cybertek coaxial shunt CSE050M10(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 5 W
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Cybertek coaxial shunt CSE01M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W
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Cybertek coaxial shunt CSE005M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W
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Cybertek coaxial shunt CSD***M series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W
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Cybertek coaxial shunt CSD***B series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W
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PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk
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Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz
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JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package
JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package
JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package
JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package
JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…


















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