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Probemart.com | Probes, current sensors & calibration sources for pulsed-power testing

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Magnelab sensor SPT-0375 transformer voltage 115 to 460 AC, 0.333 AC

Magnelab sensor SPT-0375 transformer voltage 115 to 460 AC, 0.333 AC

Magnelab sensor SPT-0375 transformer voltage 115 to 460 AC, 0.333 AC

Brand: MagneLab

Origin: USA

Voltage Probe. Detailed specifications are available in the product datasheet.

Cybertek coaxial shunt CSE050M10(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 5 W

Cybertek coaxial shunt CSE050M10(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 5 W

Cybertek coaxial shunt CSE050M10(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 5 W

Brand: Cybertek

Origin: China

Resistance 0.05 Ω, rated power 5 W, high-bandwidth 1 GHz, 20J

Cybertek coaxial shunt CSE01M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Cybertek coaxial shunt CSE01M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Cybertek coaxial shunt CSE01M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Brand: Cybertek

Origin: China

Resistance 0.01 Ω, rated power 4 W, high-bandwidth 1.5 GHz, 16J

Cybertek coaxial shunt CSE005M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Cybertek coaxial shunt CSE005M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Cybertek coaxial shunt CSE005M15(type medium-power) resistor SiC/GaN power device double-pulse dynamic test 4 W

Brand: Cybertek

Origin: China

Resistance 0.005 Ω, rated power 4 W, high-bandwidth 1.5 GHz, 15J

Cybertek coaxial shunt CSD***M series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Cybertek coaxial shunt CSD***M series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Cybertek coaxial shunt CSD***M series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Brand: Cybertek

Origin: China

400M-2G high-bandwidth, 0.005-0.1 Ω resistance

Cybertek coaxial shunt CSD***B series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Cybertek coaxial shunt CSD***B series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Cybertek coaxial shunt CSD***B series (type) resistor SiC/GaN power device double-pulse dynamic test 2 W

Brand: Cybertek

Origin: China

400M-2G high-bandwidth, 0.005-0.1 Ω resistance

PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

PMK high-low-temperature voltage probe ENVI @ PUHT 835-312-U01 probe-55 °C-200 °C high-frequency 500M/1250 Vpk

Brand: PMK

Origin: Germany

ENVI® passive probe non- test, and-55°C to +155°C medium- measurement. 835-312-U01 PUHT:-55°C to 200°C

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Cybertek passive high-voltage probe HP6603 60 kV DC+ACpk, high-frequency 50 MHz

Brand: Cybertek

Origin: China

Voltage Probe. Detailed specifications are available in the product datasheet.

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

JC power device test socket GD21-R2PAK-K-S141X146-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for R2PAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

JC power device test socket GD21-TOLT-K-S103X101-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TOLT package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

JC power device test socket GD26-QDPAK-K-S151X155 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for QDPAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

JC power device test socket GD21-HU3PAK-K-S141X142-FL semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for HU3PAK package

Brand: JC Electronics

Origin: Japan

Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…

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