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JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 package
JC power device test socket GD18-TO252-K-755 semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO252 packageBrand: JC Electronics
Origin: Japan
Power device test:SiC/GaN high-low-temperature, high-, high-voltage, high-current, low inductance. provides an…
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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100D
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High-Jectronic Jectronic dynamic and static test system semiconductor power device PHS-100S single-channel
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Vamtek dedicated SMA-MMCX interface 3G high-frequency 50 Ω probe 0.1 m /0.2 m /0.5 m /1 m /2 m high
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