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JC power device test socket T4P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package (high-temperature)

JC power device test socket T3P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package

JC power device test socket T4P-L214-ST-BK-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-4 package

JC power device test socket T3P-L214-ST-HT-P semiconductor SiC/GaN MOSFET mounting fixture dynamic / static parameters precision evaluation for TO-247-3 and TO-220 package (high-temperature)

PMK high-voltage differential probe adapter connector 4 mm to Testpoint-Adapter for BUMBLEBEE and HORNET series

PMK PHV665-L/200 high-frequency 200M high-voltage 2800 Vrms/6 kVpk oscilloscope voltage probe (200:1)

Double-pulse dynamic test system PD-200X wide-bandgap semiconductor SiC power device parameters evaluation Jectronic & Probemart

CYBERTEK high-voltage differential probe HVP6700H isolated voltage 500M high-frequency 7000 V

CYBERTEK high-voltage differential probe HVP6350H isolated voltage 500M high-frequency 3500 V

CYBERTEK high-voltage differential probe HVP6150H isolated voltage 500M high-frequency 1500 V

CYBERTEK high-voltage differential probe HVP6700G isolated voltage 350M high-frequency 7000 V

CYBERTEK high-voltage differential probe HVP6350G isolated voltage 350M high-frequency 3500 V