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PMK high-frequency HSDP series high-speed low-voltage differential probe HSDP2025 type 2 GHz high-bandwidth +/-20V PMK high-frequency HSDP series high-speed low-voltage differential probe HSDP2025 type 2 GHz high-bandwidth +/-20V Brand: PMK Origin: Germany Differential probe 2GHz, ±20V diff, ±60V common mode, 25:1, low noise Brochure Manual Details
T&M non-inductive coaxial shunt SDN-414-10 high-frequency precision SDN-414 series (2 Watt)Sic/GaN double-pulse Ids measurement T&M non-inductive coaxial shunt SDN-414-10 high-frequency precision SDN-414 series (2 Watt)Sic/GaN double-pulse Ids measurement Brand: T&M Research Origin: USA T&M SDN-414 series low inductance high-frequency coaxial resistor, 0 2% ultra-high precision, 400-2000M hi… Brochure Manual Details
PMK fixture 3D probe SKID series deg measurement PMK fixture 3D probe SKID series deg measurement Brand: PMK Origin: Germany SKID 系列是 PMK 的 PCB 测试与调试定位平台，提供 S（适配 3U PCB）、M（适配 6U PCB）、L（大于 6U 的任意 PCBA）三种框架尺寸，对应 225×225mm、305×305mm、405×3… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM6 pulse current probe 1200 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM6 pulse current probe 1200 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM3 pulse current probe 600 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM3 pulse current probe 600 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM1 pulse current probe 300 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM1 pulse current probe 300 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM06 pulse current probe 120 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM06 pulse current probe 120 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM03 pulse current probe 60 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM03 pulse current probe 60 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
North star VD series 【】 high-voltage probe North star VD series 【】 high-voltage probe Brand: North Star High Voltage Origin: USA Voltage Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details

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