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PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM150 pulse current probe 30KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test IWATSU SS-289A-H high-temperature-40 to 150 deg 12000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz IWATSU SS-531 Hall-effect current probe AC/DC high-frequency clamp rated 30 A/5 A/0.5 A bandwidth 120 MHz Brand: IWATSU Origin: Japan SS-531, rated current 30 A/5 A/0.5 A bandwidth 120 MHz, measurement AC and DC clamp-on Brochure Manual Details
PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA PEM Rogowski coil CWT Mini50HF150 high-frequency 50 MHz flexible current probe 30KA Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A PEM Rogowski coil CWT Mini50HF30 high-frequency 50 MHz flexible current probe 6000 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A PEM Rogowski coil CWT Mini50HF15 high-frequency 50 MHz flexible current probe 3000 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A PEM Rogowski coil CWT Mini50HF6 high-frequency 50 MHz flexible current probe 1200 A Brand: PEM Origin: UK CWT Mini50HF device (SiC), with 50 MHz high-frequency (-3dB) bandwidth (100 mm coil) and 36 MHz (200 optional,… Brochure Manual Details
PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm) PEM Rogowski coil CWT Mini06 mini series current transformer pulse probe 120 A (conductor diameter 3.5 mm) Brand: PEM Origin: UK Mini coil series, up to 10 MHz, conductor diameter 3.5 mm, withstand voltage 2 kV/5 kV optional Brochure Manual Details
IWATSU OpECS optically isolated current probe 150 MHz IWATSU OpECS optically isolated current probe 150 MHz Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
T&M non-inductive coaxial shunt SDN-414 series high-frequency precision resistor (2 Watt)Sic/GaN wide-bandgap double-pulse Ids measurement T&M non-inductive coaxial shunt SDN-414 series high-frequency precision resistor (2 Watt)Sic/GaN wide-bandgap double-pulse Ids measurement Brand: T&M Research Origin: USA T&M SDN-414 series low inductance high-frequency coaxial resistor, 0 2% ultra-high precision, 400-2000M hi… Brochure Manual Details
Danisense fluxgate current sensor DS1000UB-10V voltage output PPM high-precision AC/DC probe (DC/AC) Danisense fluxgate current sensor DS1000UB-10V voltage output PPM high-precision AC/DC probe (DC/AC) Brand: Danisense Origin: Denmark DS1000UB-10V measurable AC 700 A, DC 1000 A, high-current 1100A, 300KHz bandwidth Brochure Manual Details
IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C IWATSU SS-280A/SS-280A-H series high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test A-H high-temperature 150 °C Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details

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