Page 11 - Current

IWATSU Rogowski coil SS-283A/SS-285A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT

T&M non-inductive coaxial shunt SDN-414-10 high-frequency precision SDN-414 series (2 Watt)Sic/GaN double-pulse Ids measurement

PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM6 pulse current probe 1200 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM3 pulse current probe 600 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM1 pulse current probe 300 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM06 pulse current probe 120 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM CWT Ultra mini ultra-mini Rogowski coil UM03 pulse current probe 60 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test

PEM Rogowski coil CWT Mini1500 mini series current transformer pulse probe 300KA (conductor diameter 3.5 mm)

PEM Rogowski coil CWT Mini600 mini series current transformer pulse probe 120KA (conductor diameter 3.5 mm)