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High-performance type power device test socket for TO-247-3 and TO-220 3 package T3P-HH-KL-250 (high-temperature 250 °C)
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High-performance type power for 3 package / DC50A at 25°C PCB / T3P-HH-KL-220-FL
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High-performance type power for TO-247 4L package / DC50A at 25°C PCB T4P-HH-KL-220-FL
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PEM Rogowski coil high-frequency high-sensitivity CWTHF series current probe 30 A-300KA pulse high-current
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S high-frequency current probe 30 A-30KA double-pulse semiconductor device GaN/SiC test
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/150 high-frequency current probe 30KA/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/60 high-frequency current probe 12KA/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/30 high-frequency current probe 6KA/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/15 high-frequency current probe 3KA/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/6 high-frequency current probe 1200 A/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/3 high-frequency current probe 600 A/30M
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PEM Rogowski coil 1.2 mm ultra-fine ultra-mini CWTUM-S/1 high-frequency current probe 300 A/30M


















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