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IWATSU SS-281A-H/SS-282A-H high-temperature-40 to 150 deg 30 A/60 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test IWATSU SS-281A-H/SS-282A-H high-temperature-40 to 150 deg 30 A/60 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-297/SS-298/SS-299 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 30KA/60KA high-current 120KA IWATSU SS-297/SS-298/SS-299 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 30KA/60KA high-current 120KA Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-295/SS-295 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 6000 A high-current 12000 A IWATSU SS-295/SS-295 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 6000 A high-current 12000 A Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-293/SS-294 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 1200 A high-current 3000 A IWATSU SS-293/SS-294 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 1200 A high-current 3000 A Brand: IWATSU Origin: Japan Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU SS-666 ultra-fine 1 mm, SS-666P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-666 ultra-fine 1 mm, SS-666P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-665 ultra-fine 1 mm, SS-665P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-665 ultra-fine 1 mm, SS-665P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-664 ultra-fine 1 mm, SS-664P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-664 ultra-fine 1 mm, SS-664P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-663 ultra-fine 1 mm, SS-663P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-662 ultra-fine 1 mm, SS-662P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for IWATSU SS-662 ultra-fine 1 mm, SS-662P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for Brand: IWATSU Origin: Japan SS-660 (P) series conductor diameter Rogowski coil 1/1.2 mm, clamp-on for GaN device current measurement, with… Brochure Manual Details
IWATSU SS-630S/SS-630M Rogowski current probe 3 mm high-frequency 30000 A suitable for SiC module measurement IWATSU SS-630S/SS-630M Rogowski current probe 3 mm high-frequency 30000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-630S/SS-630M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-628S/SS-628M Rogowski current probe 3 mm high-frequency 6000 A suitable for SiC module measurement IWATSU SS-628S/SS-628M Rogowski current probe 3 mm high-frequency 6000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-628S/SS-628M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details
IWATSU SS-627S/SS-627M Rogowski current probe 3 mm high-frequency 3000 A suitable for SiC module measurement IWATSU SS-627S/SS-627M Rogowski current probe 3 mm high-frequency 3000 A suitable for SiC module measurement Brand: IWATSU Origin: Japan IWATSU SS-627S/SS-627M clamp-on flexible coil, for measurement, 3 mm conductor diameter, 20/25 MHz. high-frequ… Brochure Manual Details

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