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IWATSU SS-620 series Rogowski probe 3 mm high-frequency coil suitable for SiC module measurement
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PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test
PEM CWT Ultra mini ultra-mini Rogowski coil UM015 pulse current probe 30 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device testBrand: PEM
Origin: UK
CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d…
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PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test
PEM CWT Ultra mini ultra-mini Rogowski coil UM series pulse current probe 30 A-6000A (1.7 mm conductor diameter) for wide-bandgap semiconductor device testBrand: PEM
Origin: UK
CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d…
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PEM CWT LF low-frequency Rogowski coil current transformer (60 A-300kA)
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IWATSU SS-280A-H high-temperature-40 to 150 deg 30000 A high-current high-frequency Rogowski current coil probe
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IWATSU SS-500 series Hall-effect current probe AC/DC high-frequency clamp-on clamp min. measurable milliamp level
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Pearson current probe wideband pulse transformer (type)
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PEM Rogowski coil CWT MiniHF015/MiniHF03/MiniHF06 high-frequency mini pulse current probe 30 A/60 A/120 A (conductor diameter 4.5 mm)
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Magnelab high-frequency pulse current transformer CT-F0.05 ultra-fast RF FCT high-current probe EMC test large-aperture 20000 A/20M
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Magnelab high-frequency pulse current transformer CT-D0.05 ultra-fast RF FCT high-current probe EMC test medium-aperture 20000 A/20M
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FCC RF current monitoring probe F-220815-1005-1 clamp-on high-frequency EMP EMC test 400 MHz/2000 Apk
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FCC RF current monitoring probe F-220126-1005-2 clamp-on high-frequency EMP EMC test 400 MHz/100 Apk


















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