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PEM Rogowski coil CWT MiniHF015/MiniHF03/MiniHF06 high-frequency mini pulse current probe 30 A/60 A/120 A (conductor diameter 4.5 mm)
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PEM Rogowski coil CWT Mini50HF60 high-frequency 50 MHz flexible current probe 12KA
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PEM Rogowski coil CWT Mini50HF3 high-frequency 50 MHz flexible current probe 600 A
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PEM Rogowski coil CWT Mini50HF1 high-frequency 50 MHz flexible current probe 300 A
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PEM Rogowski coil CWT Mini50HF06 high-frequency 50 MHz flexible current probe 120 A
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PEM Rogowski coil CWT Mini50HF03 high-frequency 50 MHz flexible current probe 60 A
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PEM Rogowski coil CWT Mini50HF015 high-frequency 50 MHz flexible current probe 30 A
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IWATSU SS-283A-H high-temperature-40 to 150 deg 120 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test
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IWATSU SS-660/SS-660P series ultra-fine 1 mm/1.2 mm high-frequency Rogowski coil current test probe SiC device
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IWATSU Rogowski coil SS-286A high-frequency current probe 1200 A conductor diameter 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-281A/SS-282A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT
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IWATSU Rogowski coil SS-288A/SS-289A high-frequency current probe 6000 A/12000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT


















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