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Optically Isolated Current Probe High-Frequency Rogowski Current Probe High-Frequency Current Transformer (CT) High-Frequency Hall Current Probe Fluxgate Current Probe TMR Current Sensor Low-Frequency AC/DC Probe Low-Frequency Rogowski Coil AC Probe Common-Mode Current Rogowski Coil

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Magnelab high-frequency pulse current transformer CT-B0.25 ultra-fast RF FCT high-current probe EMC test small-aperture 4000 A/100M Magnelab high-frequency pulse current transformer CT-B0.25 ultra-fast RF FCT high-current probe EMC test small-aperture 4000 A/100M Brand: MagneLab Origin: USA CT-B 0.25, aperture 0.25, peak current 4000 A, high-frequency bandwidth 100M Brochure Manual Details
Magnelab high-frequency pulse current transformer CT-B0.5 ultra-fast RF FCT high-current probe EMC test small-aperture 2000 A/200M Magnelab high-frequency pulse current transformer CT-B0.5 ultra-fast RF FCT high-current probe EMC test small-aperture 2000 A/200M Brand: MagneLab Origin: USA CT-B 0.5, aperture 0.25, peak current 2000 A, high-frequency bandwidth 200M Brochure Manual Details
Magnelab high-frequency pulse current transformer CT-B1.0 ultra-fast RF FCT high-current probe EMC test small-aperture 1000 A/500M Magnelab high-frequency pulse current transformer CT-B1.0 ultra-fast RF FCT high-current probe EMC test small-aperture 1000 A/500M Brand: MagneLab Origin: USA CT-B 1.0, aperture 0.25, peak current 1000 A, high-frequency bandwidth 500M Brochure Manual Details
Magnelab high-frequency pulse current transformer CT-B2.5 ultra-fast RF FCT high-current probe EMC test small-aperture 400 A/500M Magnelab high-frequency pulse current transformer CT-B2.5 ultra-fast RF FCT high-current probe EMC test small-aperture 400 A/500M Brand: MagneLab Origin: USA CT-B 2.5, aperture 0.25, peak current 400 A, high-frequency bandwidth 500M Brochure Manual Details
Magnelab high-frequency pulse current transformer CT-B5.0 ultra-fast RF FCT high-current probe EMC test small-aperture 200 A/400M Magnelab high-frequency pulse current transformer CT-B5.0 ultra-fast RF FCT high-current probe EMC test small-aperture 200 A/400M Brand: MagneLab Origin: USA CT-B 5.0, aperture 0.25, peak current 200 A, high-frequency bandwidth 400M Brochure Manual Details
IWATSU Rogowski coil SS-287A high-frequency current probe 3000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT IWATSU Rogowski coil SS-287A high-frequency current probe 3000 A conductor diameter 1.7 mm for TO type MOSFET and IGBT Brand: IWATSU Origin: Japan 1.7 mm ultra-mini conductor diameter, high-frequency bandwidth 30M, SS-287A range 3000 A Brochure Manual Details
Magnelab FCT high-speed pulse RF current transformer EMC test high-frequency high-current probe Magnelab FCT high-speed pulse RF current transformer EMC test high-frequency high-current probe Brand: MagneLab Origin: USA Isolated Current Probe. Detailed specifications are available in the product datasheet. Brochure Manual Details
IWATSU Rogowski coil SS-284A high-frequency current probe 300 A conductor diameter 1.7 mm for TO type MOSFET and IGBT IWATSU Rogowski coil SS-284A high-frequency current probe 300 A conductor diameter 1.7 mm for TO type MOSFET and IGBT Brand: IWATSU Origin: Japan 1.7 mm ultra-mini conductor diameter, high-frequency bandwidth 30M, SS-284A range 300 A Brochure Manual Details
IWATSU Rogowski coil SS-283A/SS-285A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT IWATSU Rogowski coil SS-283A/SS-285A high-frequency current probe 1.7 mm for TO type MOSFET and IGBT Brand: IWATSU Origin: Japan 1.7 mm ultra-mini conductor diameter, high-frequency bandwidth 30M, SS-283A range 120 A, SS-285A 600 A Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM60 pulse current probe 12KA (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM30 pulse current probe 6000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details
PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test PEM CWT Ultra mini ultra-mini Rogowski coil UM15 pulse current probe 3000 A (1.7 mm conductor diameter) for wide-bandgap semiconductor device test Brand: PEM Origin: UK CWT Ultra mini UM)Rogowski coil max. cross-section diameter 1 7 mm, semiconductor. bandwidth up to 30 MHz (-3d… Brochure Manual Details

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