Page 7 - Current IWATSU

Probemart IWATSU Rogowski coil powered dedicated power supply adapter

IWATSU SS-540 Hall-effect current probe AC/DC high-frequency clamp rated 30 A bandwidth 50 MHz

IWATSU SS-288A-H high-temperature-40 to 150 deg 6000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-287A-H high-temperature-40 to 150 deg 3000 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-286A-H high-temperature-40 to 150 deg 1200 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-285A-H high-temperature-40 to 150 deg 600 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-284A-H high-temperature-40 to 150 deg 300 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-281A-H/SS-282A-H high-temperature-40 to 150 deg 30 A/60 A high-frequency Rogowski current coil probe 1.7 mm for SiC device GaN test

IWATSU SS-297/SS-298/SS-299 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 30KA/60KA high-current 120KA

IWATSU SS-295/SS-295 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 6000 A high-current 12000 A

IWATSU SS-293/SS-294 Rogowski probe 8.5 mm coil high-frequency pulse current transformer 1200 A high-current 3000 A

IWATSU SS-666 ultra-fine 1 mm, SS-666P conductor diameter 1.2 mm high-frequency Rogowski current probe SiC device test TO-247-4 for